Raman and infrared spectroscopy of α and β phases of thin nickel hydroxide films electrochemically formed on nickel

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DOIResolve DOI: http://doi.org/10.1021/jp303546r
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TypeArticle
Journal titleThe Journal of Physical Chemistry A
Volume116
Issue25
Pages67716784; # of pages: 14
AbstractThe present work utilizes Raman and infrared (IR) spectroscopy, supported by X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) to re-examine the fine structural details of Ni(OH)2, which is a key material in many energy-related applications. This work also unifies the large body of literature on the topic. Samples were prepared by the galvanostatic basification of nickel salts and by aging the deposits in hot KOH solutions. A simplified model is presented consisting of two fundamental phases (α and β) of Ni(OH)2 and a range of possible structural disorder arising from factors such as impurities, hydration, and crystal defects. For the first time, all of the lattice modes of β-Ni(OH)2 have been identified and assigned using factor group analysis. Ni(OH)2 films can be rapidly identified in pure and mixed samples using Raman or IR spectroscopy by measuring their strong O–H stretching modes, which act as fingerprints. Thus, this work establishes methods to measure the phase, or phases, and disorder at a Ni(OH)2 sample surface and to correlate desired chemical properties to their structural origins.
Publication date
LanguageEnglish
AffiliationEnergy, Mining and Environment; Information and Communication Technologies; National Research Council Canada
Peer reviewedYes
NRC number53091
NPARC number20641671
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Record identifierb3b680ee-2127-4e26-a132-aca16a447a3c
Record created2012-09-15
Record modified2016-05-09
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