Frequency resolved high-harmonic wavefront characterization

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DOIResolve DOI: http://doi.org/10.1364/OL.34.003026
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TypeArticle
Journal titleOptics letters
Volume34
Issue19
Pages30263028; # of pages: 3
AbstractWe introduce and demonstrate a novel concept of frequency-resolved wavefront characterization. Our approach is particularly suitable for high-harmonic, extreme-UV (XUV) and soft X-ray radiation. The concept is based on an analysis of radiation diffracted from a slit scanned in front of a flat-field XUV spectrometer. With the spectrally resolved signal spread across one axis and the spatially resolved diffraction pattern in the other dimension, we reconstruct the wavefront. While demonstrated for high harmonics, the method is not restricted in wavelength.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada
Peer reviewedYes
NPARC number15203842
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Record identifierb4274a09-6525-444f-9cc3-1e2e3efac04d
Record created2010-07-12
Record modified2016-05-09
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