Experimental determination of Auger capture coefficients in InAs/GaAs self-assembled dots

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TypePresentation
ConferenceICPS25: 25th International Conference on the Physics of Semiconductors, 17-22 September 2000, Osaka, Japan
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
NoteThis presentation is not published in "Proceedings of the 25th International conference on the physics of semiconductors Part I"
Peer reviewedNo
NPARC number12346771
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Record identifierb57d6e1b-927b-4f6e-88a2-19c014bfd0e7
Record created2009-09-17
Record modified2016-05-09
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