Characterization of Gd2O3 Films Deposited on Si(100) by Electron-Beam Evaporation

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DOIResolve DOI: http://doi.org/10.1149/1.1337607
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TypeArticle
Journal titleJournal of The Electrochemical Society
Volume148
PagesG29
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada; NRC Institute for National Measurement Standards
Peer reviewedNo
NPARC number12744903
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Record identifierb5c72d27-a729-4794-b57a-14f4ddcd49a0
Record created2009-10-27
Record modified2016-05-09
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