Electrical Characterization and Surface Morphology of Optimized Ti/Al/Ti/Au Ohmic Contacts for AlGaN/GaN HEMTs

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DOIResolve DOI: http://doi.org/10.1149/1.2206998
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TypeArticle
Journal titleJournal of The Electrochemical Society
Volume153
Issue8
PagesG746G749
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744706
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Record identifierb804ce82-6f77-4019-b809-be6ca2856bfe
Record created2009-10-27
Record modified2016-05-09
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