Extending chi-squared statistics for key comparisons in metrology

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DOIResolve DOI: http://doi.org/10.1016/j.cam.2005.04.041
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TypeArticle
ConferenceCMMSE-2004 : International Conference on Computational and Mathematical Methods in Science and Engineering, June 4-8, 2004, Uppsala, Sweden
ISSN0377-0427
Volume192
IssueJuly 15, 1
Pages5158; # of pages: 8
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards; National Research Council Canada
Peer reviewedNo
NRC number2344
NPARC number8896590
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Record identifierb8361adc-a102-484f-ab27-36e9ec434456
Record created2009-04-22
Record modified2016-05-09
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