In-line holography of embedded nanoparticles in a TEM

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Proceedings titleMicroscopy and Microanalysis
ConferenceMicroscopy and Microanalysis 2009, 26-30 July 2009, Richmond, Virginia, USA
IssueSupplement S2
Pages12381239; # of pages: 2
Publication date
PublisherCambridge University Press
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number19739585
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Record identifierb940c75a-3ee2-4a17-83b4-dcf5244deff9
Record created2012-03-30
Record modified2016-05-09
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