RF passive devices on Si with excellent performance, close to ideal devices designed by electro-magnetic simulation

Alternative titleIEEE Int’l Electron Device Meeting Technical Digest
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TypeArticle
ConferenceIEEE Int’l Electron Device Meeting, 2003
Volume375
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number3539221
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Record identifierbb431d21-f8a3-44c2-9656-11baec684532
Record created2009-03-01
Record modified2016-05-09
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