Priming and testing silicon patch-clamp neurochips

  1. Get@NRC: Priming and testing silicon patch-clamp neurochips (Opens in a new window)
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Journal titleNew Biotechnology
Pages430435; # of pages: 6
SubjectCapacitance; Plasma applications; Silicon; Air plasmas; Automated setup; Manual assembly; Neuro-chips; Patch-clamp; Planar patch clamps; Shunt capacitance; Testing time; Electrophysiology; glue; poly(methyl methacrylate); silicon; accuracy; air plasma reactor; article; automation; biochip; biocompatibility; bioreactor; controlled study; electric potential; electrophysiology; instrument sterilization; materials testing; nanofabrication; neurochip; planar patch clamp; priority journal
AbstractWe report on the systematic and automated priming and testing of silicon planar patch-clamp chips after their assembly in Plexiglas packages and sterilization in an air plasma reactor. We find that almost 90% of the chips are successfully primed by our automated setup, and have a shunt capacitance of between 10. pF and 30. pF. Blocked chips are mostly due to glue invasion in the well, and variability in the manual assembly process is responsible for the distribution in shunt capacitance value. Priming and testing time with our automated setup is less than 5. min per chip, which is compatible with the production of large series for use in electrophysiology experiments.
Publication date
AffiliationInformation and Communication Technologies; Medical Devices; National Research Council Canada
Peer reviewedYes
NPARC number21272750
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Record identifierbb6f67cd-4a0a-441d-8c79-226d4e78bbac
Record created2014-12-03
Record modified2016-05-09
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