ADF-STEM imaging of strained GaN0045As0955 epitaxial layers on 100 GaAs substrates

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TypeArticle
ConferenceMater Res Soc Sym
Volume982
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12346425
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Record identifierc0eb470e-78b9-44e3-8a1e-c791c9c6c7f4
Record created2009-09-17
Record modified2016-05-09
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