GaAs homojunction interfacial workfunction internal photoemission (HIWIP) far-infrared detectors

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DOIResolve DOI: http://doi.org/10.1016/S0921-5107(99)00534-6
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TypeArticle
Journal titleMaterials Science & Engineering B
Volume74
Issue1-3
Pages5660; # of pages: 5
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744865
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Record identifierc3830e5c-3935-49e5-89be-b58ad2a2cd4e
Record created2009-10-27
Record modified2016-05-09
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