Monte Carlo uncertainties: choosing parent distributions

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TypeArticle
ConferenceNMIJ-BIPM Workshop on the Impact of Information Technology in Metrology, May 18-20, 2005, Tokyo, Japan
Pages20 p.
Linkhttp://www.bipm.org/utils/common/pdf/nmij-bipm/WS-32.pdf
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards; National Research Council Canada
Peer reviewedNo
NRC number2883
NPARC number5765588
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Record identifierc7ec6400-9e8d-4dad-8d4a-9c370ead6751
Record created2009-03-29
Record modified2016-05-09
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