Temperature measurement in a tem using electron diffraction of amorphous films

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DOIResolve DOI: http://doi.org/10.1017/S1431927617005414
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TypeArticle
Journal titleMicroscopy and Microanalysis
ISSN1431-9276
1435-8115
Volume23
IssueS1
Pages950951
Publication date
PublisherCambridge University Press
LanguageEnglish
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number23002379
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Record identifierc8eb11b0-c441-4ec1-815d-5f04eef3cacf
Record created2017-10-25
Record modified2017-10-25
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