Second-order susceptibility measurement of thin films by reflective second harmonic generation method - toward measurement standards in nonlinear optics

Alternative titleSPIE
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TypeArticle
Volume5577
Pages413422; # of pages: 10
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12346795
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Record identifiercbb8486d-ce57-4890-84ed-51fde66ba6b5
Record created2009-09-17
Record modified2016-05-09
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