Electron energy loss spectroscopy of interfacial layer formation in Gd2O3 films deposited directly on Si(001)

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DOIResolve DOI: http://doi.org/10.1063/1.1446232
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TypeArticle
Journal titleJournal of Applied Physics
Volume91
Issue5
Pages2921
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada; NRC Institute for National Measurement Standards
Peer reviewedNo
NPARC number12743764
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Record identifiercde929d3-af7e-4173-b088-8129d3347b09
Record created2009-10-27
Record modified2016-05-09
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