Physical principles underlying instrument optimization for imaging of radiation sensitive samples

TypeArticle
Publication date
AffiliationNRC National Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NRC number35
NPARC number8926480
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Record identifierd0dafdea-1a2c-43fb-a0c8-a7ca2fae3935
Record created2009-04-23
Record modified2016-05-09
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