Structural Characterization of InAs/GaAs and InAs/InP Quantum Dots by Transmission Electron Microscopy

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TypeArticle
ConferenceMaterials Research Society Symposium, 2001
Volume642
PagesJ851J8510
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada; NRC Institute for National Measurement Standards
Peer reviewedNo
NPARC number12346577
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Record identifierd18065d4-9724-4415-a479-3870215fea15
Record created2009-09-17
Record modified2016-05-09
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