Basic questions related to electron-induced sputtering

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DOIResolve DOI: http://doi.org/10.1017/S1431927609092204
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TypeArticle
Proceedings titleMicroscopy and Microanalysis
ConferenceMicroscopy and Microanalysis 2009, 26-30 July 2009, Richmond, Virginia, USA
Volume15
IssueSupplement S2
Pages13561357; # of pages: 2
Publication date
PublisherCambridge University Press
LanguageEnglish
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number19739587
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Record identifierd479604e-772e-45dc-acc1-e04e2b20e435
Record created2012-04-02
Record modified2016-05-09
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