A Stereo Vision System for On-Machine Dimensional Metrology

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TypeArticle
ConferenceSPIE Proceedings, Applications of Artificial Intelligence VII, March 28-30, 1989., Orlando, Florida, USA
Volume1095
Publication date
LanguageEnglish
AffiliationNRC Institute for Information Technology; National Research Council Canada
Peer reviewedNo
NRC number30105
NPARC number5765189
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Record identifierd686df5a-3b69-4689-a79d-45e4454b63f2
Record created2009-03-29
Record modified2016-05-09
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