Time resolved electroluminescence measurements on GaAs, GaN and Si semiconductor circuitry

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DOIResolve DOI: http://doi.org/10.1116/1.2172931
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TypeArticle
Journal titleJournal of Vacuum Science & Technology A
Volume24
Issue3
Pages686689; # of pages: 4
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744292
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Record identifierd9b77242-7856-493d-8ea5-c949d6aed5ab
Record created2009-10-27
Record modified2016-05-09
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