Extending chi-squared statistics for key comparisons in metrology

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TypeArticle
ConferenceProceedings of the 2004 International Conference on Computational and Mathematical Methods in Science and Engineering (CMMSE 2004), June 4-8, 2004, Uppsala, Sweden
Pages251260; # of pages: 10
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards; National Research Council Canada
Peer reviewedNo
NRC number773
NPARC number5764833
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Record identifiere0de74f2-efa1-40e8-9b46-dd9654f840c4
Record created2009-03-29
Record modified2016-05-09
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