Thermal Oxidation of III-V Semiconductors for Device Alications

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TypeArticle
ConferenceInt Sym on High Temperature Corrosion and Protection 2000, September 2000, Hokkaido, Japan
Volume
Pages39
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada; NRC Institute for National Measurement Standards
Peer reviewedNo
NPARC number12346212
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Record identifiere13178a5-fe81-4920-beb5-1c9408e38556
Record created2009-09-17
Record modified2016-05-09
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