XAFS and X-ray Reflectivity Study of III-V Compound Native Oxide/GaAs Interfaces

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DOIResolve DOI: http://doi.org/10.1107/S0909049501001248
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TypeArticle
Journal titleJournal of Synchrotron Radiation
Volume8
Pages824826; # of pages: 3
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12743780
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Record identifiere223db3c-af86-4bec-bb83-606a8e4af928
Record created2009-10-27
Record modified2016-05-09
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