Stress induced birefringence in silicon-on-insulator SOI waveguides

Alternative titleOptoelectronic Integration on Silicon II, SPIE 2004
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TypeArticle
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12346742
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Record identifiere2a01e75-3139-41d9-9055-5e42ed646957
Record created2009-09-17
Record modified2016-05-09
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