Inelastic light scattering spectroscopy in si/SiGe nanostructures: strain, chemical composition and thermal properties

Download
  1. (PDF, 766 KB)
  2. Get@NRC: Inelastic light scattering spectroscopy in si/SiGe nanostructures: strain, chemical composition and thermal properties (Opens in a new window)
DOIResolve DOI: http://doi.org/10.1016/j.ssc.2016.07.008
AuthorSearch for: ; Search for: ; Search for: ; Search for: ; Search for: ; Search for:
TypeArticle
Journal titleSolid State Communications
ISSN0038-1098
1879-2766
SubjectNanostructures; Molecular Beam Epitaxy; Inelastic Light Scattering; Raman Scattering
AbstractWe present a review of recent studies of inelastic light scattering spectroscopy in two types of Si/SiGe nanostructures: planar superlattices and cluster (dot) multilayers including first- and second-order Raman scattering, polarized Raman scattering and low-frequency inelastic light scattering associated with folded acoustic phonons. The results are used in semi-quantitative analysis of chemical composition, strain and thermal conductivity in these technologically important materials for electronic and optoelectronic devices.
Publication date
PublisherElsevier
LanguageEnglish
AffiliationInformation and Communication Technologies; Measurement Science and Standards; National Research Council Canada
In pressYes
Peer reviewedYes
NPARC number23000477
Export citationExport as RIS
Report a correctionReport a correction
Record identifiere7469215-77b6-45da-b380-175305bd4da2
Record created2016-07-22
Record modified2016-07-22
Bookmark and share
  • Share this page with Facebook (Opens in a new window)
  • Share this page with Twitter (Opens in a new window)
  • Share this page with Google+ (Opens in a new window)
  • Share this page with Delicious (Opens in a new window)