Improved background-fitting algorithms for ionization edges in electron energy-loss spectra

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DOIResolve DOI: http://doi.org/10.1016/S0304-3991(01)00155-3
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TypeArticle
Journal titleUltramicroscopy
ISSN0304-3991
Volume92
Issue2
Pages4756; # of pages: 10
AbstractWe discuss improved procedures for fitting a power-law background to an ionization edge in an electron energy-loss spectrum. They place constraints on the background, both above and below the ionization-threshold energy, and are of particular advantage in the case of weak edges arising from low elemental concentrations. The algorithms are currently implemented as short Calculator programs for Gatan EL/P software. Their advantages and limitations are discussed, in comparison with multiple-least-squares and spatial-difference techniques.
Publication date
LanguageEnglish
Peer reviewedYes
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Identifier10038139
NPARC number12329163
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Record identifiere8b53b2d-ec10-44e5-9aa3-9d2ea84c47a4
Record created2009-09-10
Record modified2016-05-09
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