Two-Dimensional Profiling of Carriers in a Buried Heterostructure Multi-Quantum-Well Laser: Calibrated Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy

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DOIResolve DOI: http://doi.org/10.1116/1.1511211
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TypeArticle
Journal titleJournal of Vacuum Science & Technology B
Volume20
Issue5
Pages21262132; # of pages: 7
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744803
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Record identifiere95e92d8-5414-4ad9-b986-93c894e2bcca
Record created2009-10-27
Record modified2016-05-09
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