Electrical Scanning Probe Microscopy: Investigating the Inner Workings of Electronic Devices

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DOIResolve DOI: http://doi.org/10.1080/10408430590952523
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TypeArticle
Journal titleCritical Reviews in Solid State and Material Sciences
Volume30
Issue2
Pages71124; # of pages: 54
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12743830
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Record identifiere97a6357-094a-4e44-b15e-a06425b99fb4
Record created2009-10-27
Record modified2016-05-09
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