Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS)

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DOIResolve DOI: http://doi.org/10.1016/j.ultramic.2009.05.011
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TypeArticle
Journal titleUltramicroscopy
Volume109
Issue10
Pages12451249; # of pages: 5
Subjectbulk plasmon; electron energy-loss spectroscopy (EELS); fourier-ratio deconvolution; interface plasmon; plural scattering; richardson-Lucy (RL) deconvolution; surface plasmon
AbstractWe discuss several ways of using Fourier-ratio deconvolution to process low-loss spectra. They include removal of the tail arising from the zero-loss peak, extraction of the spectrum of a particle from data recorded from the particle on a substrate, separation of the bulk and surface components in spectra recorded from samples of the same composition but different thickness, and investigation of interface energy-loss modes. We also demonstrate the use of a Bayesian-equivalent procedure based on the Richardson-Lucy algorithm.
Publication date
LanguageEnglish
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number19734717
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Record identifiereb2c2be1-e8c4-45bf-a307-bf743bb0b2b7
Record created2012-04-02
Record modified2016-05-09
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