Use of pressure for quantum-well-band-structure characterization

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TypeArticle
Proceedings titleSemiconductor Characterization: Present Status and Future Needs
ConferenceInternational Workshop on Semiconductor Characterization: Present Status and Future Needs, January 30 - February 2, 1995, Gaithersburg, MD, USA
ISBN1563965038
9781563965036
Pages634638; # of pages: 5
Publication date
PublisherAIP Press
LanguageEnglish
AffiliationNational Research Council Canada; NRC Institute for Microstructural Sciences
Peer reviewedNo
NPARC number12338602
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Record identifierebd36747-09ad-4a3c-bb5a-ac0319a55d37
Record created2009-09-10
Record modified2016-05-09
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