High bandwidth electron tunneling trasnducer using frequency downmixing readout of nanomechanical motion

DOIResolve DOI: http://doi.org/10.1109/TRANSDUCERS.2011.5969134
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TypeArticle
Proceedings title2011 16th International Solid-State Sensors, Actuators and Microsystems Conference, TRANSDUCERS'11
Conference2011 16th International Solid-State Sensors, Actuators and Microsystems Conference, TRANSDUCERS'11, 5 June 2011 through 9 June 2011, Beijing
ISBN9781457701573
Article number5969134
Pages6063; # of pages: 4
SubjectDisplacement transducer; frequency downmixing; High bandwidth; High frequency vibration; Measuring circuit; Nanomechanical motion; NEMS devices; Quantum tunneling; Read-out circuit; Sample surface; Tip apex; Tunneling junctions; Actuators; Bacteriophages; Bandwidth; Electrons; Microsystems; Solid state devices; Solid-state sensors; Electron tunneling
AbstractElectron tunneling transduction based on quantum tunneling is very sensitive to the change of the distance from the probing tip apex to the sample surface and can be used as displacement transducer to detect the miniscule displacement of NEMS devices. However a limitation in electron tunneling transduction is the low detection bandwidth due to readout circuit frequency rolloff at a few 10's kHz. Here a novel electron tunneling transduction utilizing frequency downmixing directly in the tunneling junction overcomes the limitation of the detection bandwidth [1]. With this technique the high frequency vibration modes of doubly-clamped beams are measured, well above the RC rolloff of the STM measuring circuits. © 2011 IEEE.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada (NRC-CNRC); National Institute for Nanotechnology (NINT-INNT)
Peer reviewedYes
NPARC number21271099
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Record identifierec39510c-4419-4b2c-bd66-06bc704924ab
Record created2014-03-24
Record modified2016-05-09
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