Structural Characterization of a Coarsegrained Transparent Silicon Carbide Powder by a Combination of Powder Diffraction Techniques

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DOIResolve DOI: http://doi.org/10.1524/zksu.2009.0009
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TypeArticle
Journal titleZ Kristallogr Suppllement
Volume30
Pages6166; # of pages: 6
AbstractDiffraction of hard synchrotron radiation as well as constant-wavelength and time-of-flight neutron diffraction were used for the structural characterization of a silicon carbide powder having extremely low levels of chemical impurities, high perfection of the crystalline lattice and a grain size of up to 150 μm. The presence of three polytypes was ascertained and the ratios of their mass fractions were determined to be w15R : w6H = 0.002,3(8) and w4H : w6H = 0.000,6(2).
Publication date
LanguageEnglish
AffiliationNRC Canadian Neutron Beam Centre; National Research Council Canada
Peer reviewedYes
NPARC number14791390
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Record identifierf0b4230c-2863-4b91-b057-0a4ecdb71578
Record created2011-02-15
Record modified2016-05-09
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