The surface topography of cracks in strained In0.72Ga0.28P films

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DOIResolve DOI: http://doi.org/10.1080/09500830050110468
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TypeArticle
Journal titlePhilosophical magazine letters
Volume80
Issue8
Pages535541; # of pages: 7
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744241
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Record identifierf8cfdd04-53da-41ae-ace2-4aa63a2f0883
Record created2009-10-27
Record modified2016-05-09
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