Annular dark field image contrast of strained GaNyAs1-y epitaxial layers on GaAs

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TypeArticle
ConferenceMicroscopy & Microanalysis 2007, 39295, Fort Lauderdale, Florida, USA
Pages830
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12346407
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Record identifierf97c6540-0c84-48ce-a463-61c24b5a3258
Record created2009-09-17
Record modified2016-05-09
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