A mechanism for the oxidation-related influence on the thermoelectric behavior of palladium

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DOIResolve DOI: http://doi.org/10.1007/s10765-010-0748-2
AuthorSearch for: ; Search for:
TypeArticle
Journal titleInternational journal of thermophysics
Volume31
Issue8-9
Pages14021416; # of pages: 15
SubjectOxidation; Oxide; Palladium; Strain; Thermocouple; Thermoelectricity
AbstractOxidation of thermocouple elements can degrade the accuracy of thermocouple-based temperature measurements. As a particular example of such effects, oxidation of the Pd element of a platinum/palladium thermocouple is known to increase the thermoelectric emf by an amount equivalent to a temperature change of the order of 100mK to 200mK at 420 ◦C (G. W. Burns, D. C. Ripple, Proceedings of TEMPMEKO ‘96, 6th International Symposium on Temperature and Thermal Measurements in Industry and Science. Levrotto and Bella, Torino, 1997, 171–176). A possible physical mechanism to explain how oxidation affects the thermoelectric output of a Pt/Pd thermocouple is proposed. The analysis hinges on the hypothesis that the oxide-induced strain within the Pd thermoelement leads to a change in the Seebeck coefficient, and therefore to the thermoelectric emf.Atheoretical model relating deformation of the palladium lattice to the change in the Seebeck coefficient is presented. The level of agreement between the calculation and the experimental observations suggests that oxide-induced strain in the Pd thermoelement is a likely explanation for the change in thermoelectric output of a Pt/Pd thermocouple within the temperature range where oxidation is active.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada (NRC-CNRC); NRC Institute for National Measurement Standards
Peer reviewedYes
NPARC number16420783
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Record identifierfa92e9fc-3737-4f95-821d-ed81b5bed227
Record created2010-11-25
Record modified2016-05-09
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