Ultrahigh Vacuum Scanning Electron/Tunnelling Combined Microscope System

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EditorSearch for: Shimizu, R.; Search for: Williams, D.
TypeArticle
ConferenceMicrobeam Analysis 2000, 2000, Bristol
Pages375
PublisherInstitute of Physics Publishing
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12346439
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Record identifierfb208f6c-2f8b-4215-b1d2-012d3f50fa2d
Record created2009-09-17
Record modified2016-05-09
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