High Precision Control of Galvanometer Scanner

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TypeArticle
ConferenceSPIE Proceedings, 31st Symposium on Optical Optoelectronic Science Engineering, August 16-21, 1987., San Diego, California, USA
Volume817
Publication date
LanguageEnglish
AffiliationNRC Institute for Information Technology; National Research Council Canada
Peer reviewedNo
NRC number28048
NPARC number5763989
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Record identifierfe121c89-9b75-43dc-bd43-a7d15d296e36
Record created2009-03-29
Record modified2016-05-09
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