Infrared ellipsometry of GaAs epilayers on Si(100)

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DOIResolve DOI: http://doi.org/10.1063/1.1561577
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TypeArticle
Journal titleApplied physics letters
ISSN0003-6951
Volume82
IssueMarch 17, 11
Pages17301732; # of pages: 3
Publication date
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards; NRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
Identifier10100234
NRC number352
NPARC number8896488
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Record identifierfe858d36-4abc-4934-8be2-9e3d428c94dd
Record created2009-04-22
Record modified2016-05-09
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