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RSS feed17  publications found

 
1. GD & T-based characterization of short-range non-contact 3D imaging systems NPArC # 21262547  
Search for MacKinnon, David; Search for Carrier, Benjamin; Search for Beraldin, Jean-Angelo; Search for Cournoyer, Luc
International Journal of Computer Vision, ISSN: 0920-5691, 102 (1-3), 2013-03, p. 56-72
Resolve DOI: http://dx.doi.org/10.1007/s11263-012-0570-3
Find@CISTI GD & T-based characterization of short-range non-contact 3D imaging systems NPArC # 21262547 (Opens in a new window)Find@CISTI GD & T-based characterization of short-range non-contact 3D imaging systems NPArC # 21262547
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2. Lateral resolution challenges for triangulation-based three-dimensional imaging systems NPArC # 20496821  
Search for MacKinnon, David; Search for Beraldin, Jean-Angelo; Search for Cournoyer, Luc; Search for Picard, Michel; Search for Blais, Francois
Optical Engineering, 51 (2), 2012-03-02
Resolve DOI: http://dx.doi.org/10.1117/1.OE.51.2.021111
Find@CISTI Lateral resolution challenges for triangulation-based three-dimensional imaging systems NPArC # 20496821 (Opens in a new window)Find@CISTI Lateral resolution challenges for triangulation-based three-dimensional imaging systems NPArC # 20496821
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3. Hierarchical Characterization Procedures for Dimensional Metrology NPArC # 16512474
Search for MacKinnon, David; Search for Beraldin, Jean-Angelo; Search for Cournoyer, Luc; Search for Carrier, Benjamin
Society of Photo-Optical Instrumentation & Electronics & Society for Imaging Science and Technology - Electronic Imaging 2011 Conference, (Society of Photo-Optical Instrumentation & Electronics & Society for Imaging Science and Technology - Electronic Imaging 2011 Conference, San Francisco, California, January 23-27, 2011), 2011
View full text Hierarchical Characterization Procedures for Dimensional Metrology NPArC # 16512474
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4. Proposed NRC Portable Target Case for Short-Range Triangulation-Based 3-D Imaging Systems Characterization NPArC # 16512472
Search for Carrier, Benjamin; Search for MacKinnon, David; Search for Cournoyer, Luc; Search for Beraldin, J.-Angelo
SPIE Electronic Imaging 2011, (IS&T: SPIE Electronic Imaging 2011, San Francisco, California, January 23-27, 2011), 2011
View full text Proposed NRC Portable Target Case for Short-Range Triangulation-Based 3-D Imaging Systems Characterization NPArC # 16512472
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5. Assessing the Performance of 3D-Imaging Systems NPArC # 16512467  
Search for MacKinnon, David K.
2011-03-09
Resolve DOI: http://dx.doi.org/10.1117/2.1201102.003393
Find@CISTI Assessing the Performance of 3D-Imaging Systems NPArC # 16512467 (Opens in a new window)Find@CISTI Assessing the Performance of 3D-Imaging Systems NPArC # 16512467
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6. Measurement quality metrics for rapid laser range scanning NPArC # 15196503  
Search for MacKinnon, David; Search for Blais, François; Search for Aitken, Victor
SPIE Journal of Electronic Imaging, 19 (1), 2010-08-01, p. 0111004-1-0111004-12
Resolve DOI: http://dx.doi.org/10.1117/1.3267094
Find@CISTI Measurement quality metrics for rapid laser range scanning NPArC # 15196503 (Opens in a new window)Find@CISTI Measurement quality metrics for rapid laser range scanning NPArC # 15196503
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7. Proposed Traceable Structural Resolution Protocols for 3D Imaging Systems NPArC # 15703735
Search for MacKinnon, David; Search for Beraldin, J.-Angelo; Search for Cournoyer, Luc; Search for Carrier, Benjamin; Search for Blais, François
Proceedings of the Videometrics, Range Imaging and Applications X, 2009, (Videometrics, Range Imaging and Applications X, San Diego, California, August 2-3, 2009), 2009-08-03
View full text Proposed Traceable Structural Resolution Protocols for 3D Imaging Systems NPArC # 15703735
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8. Evaluating laser range scanner lateral resolution in 3D metrology NPArC # 21268151  
Search for MacKinnon, David; Search for Beraldin, J.-Angelo; Search for Cournoyer, Luc; Search for Blais, Francois
Three-Dimensional Imaging Metrology, ISSN: 0277-786X, 2009-01-18, p. 72390P-1-72390P-10
Resolve DOI: http://dx.doi.org/10.1117/12.805868
Find@CISTI Evaluating laser range scanner lateral resolution in 3D metrology NPArC # 21268151 (Opens in a new window)Find@CISTI Evaluating laser range scanner lateral resolution in 3D metrology NPArC # 21268151
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9. Adaptive Laser Range Scanning using Quality Metrics NPArC # 9062467
Search for MacKinnon, David; Search for Aitken, V.; Search for Blais, François
(The 20th Annual IS&T/SPIE Symposium on Electronic Imaging, January 27-31, 2008., San Jose, California, USA), 2008
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10. Review of Measurement Quality Metrics for Range Imaging NPArC # 16312864  
Search for MacKinnon, David; Search for Aitken, Victor; Search for Blais, François
Journal of Electronic Imaging, 17 (3), 2008-07-25
Resolve DOI: http://dx.doi.org/10.1117/1.2955245
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11. Adaptive Laser Range Scanning NPArC # 5763817
Search for MacKinnon, David; Search for Aitken, V.; Search for Blais, François
Proceedings of the 2008 American Controls Conference, (American Control Conference, 11-13 June 2008, Seattle, Washington, USA), ISBN: 978-1-4244-2078-0, 2008, p. 3857-3862
Resolve DOI: http://dx.doi.org/10.1109/ACC.2008.4587095
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12. Using quality metrics with laser range scanners NPArC # 21268153  
Search for MacKinnon, David; Search for Aitken, Victor; Search for Blais, Francois
Three-Dimensional Image Capture and Applications, ISSN: 0277-786X, 2008-02-25, p. 68050G-1-68050G-12
Resolve DOI: http://dx.doi.org/10.1117/12.766522
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13. A comparison of precision and accuracy in triangulation laser range scanners NPArC # 21268125
Search for MacKinnon, David K.; Search for Aitken, Victor; Search for Blais, Francois
Proceedings of the Canadian Conference on Electrical and Computer Engineering (CCECE '06), (Canadian Conference on Electrical and Computer Engineering CCECE '06, 7-10 May 2006, Ottawa, Ontario, Canada), ISBN: 1-4244-0038-4, 2006-05, p. 832-837
Resolve DOI: http://dx.doi.org/10.1109/CCECE.2006.277607
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14. A psychometric approach to edge detector calibration in grey-scale images NPArC # 21268160
Search for MacKinnon, David K.; Search for Aitken, Victor C.
Proceedings of the IEEE Instrumentation and Measurement Technology Conference 2005 (IMTC 2005), (2005 IEEE Instrumentation and Measurement Technology Conference, 17-19 May 2005, Ottawa, Ontario, Canada), 3, ISBN: 0-7803-8879-8, 2005-05, p. 2059-2064
Resolve DOI: http://dx.doi.org/10.1109/IMTC.2005.1604536
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15. Object Location using Edge-Bounded Planar Surfaces from Sparse Range Data NPArC # 5765605
Search for MacKinnon, David; Search for Blais, François; Search for Aitken, C.
CCGEI 2003 Canadian Conference on Electrical and Computer Engineering, TF289, (IEEE Canada, May 4-7, 2003.), 2003
View full text Object Location using Edge-Bounded Planar Surfaces from Sparse Range Data NPArC # 5765605
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16. Modeling an Auto-Synchronizing Laser Range Scanner NPArC # 8914029
Search for MacKinnon, David; Search for Blais, François; Search for Aitken, D.
(American Control Conference (ACC) 2003, June 4-6, 2003., Denver, Colorado, USA), 2003
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17. Sweeteners NPArC # 8913161
Search for MacKinnon, David
Food Additives Databook, ISBN: 9780632063956, 2003, p. 901-1003
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Date Created: 2010-03-29
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