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1. Extension of NRC fluorescence measurement capabilities NPArC # 20955694
Search for Zwinkels, Joanne; Search for Noel, Mario; Search for Neil, Bill
2012-06-01
View full text Extension of NRC fluorescence measurement capabilities NPArC # 20955694
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2. Comparison of NRC goniometric and integrating sphere methods for realizing an absolute diffuse reflectance scale NPArC # 21196171
Search for Baribeau, Réjean; Search for Zwinkels, Joanne
Reflection, Scattering, and Diffraction from Surfaces III, (Rlection, Scattering, and Diffraction from Surfaces III, 13-16 August 2012, San Diego, California, USA), 2012-10-16, p. 84950A-1-84950A-10
Resolve DOI: http://dx.doi.org/10.1117/12.930794
Share It Comparison of NRC goniometric and integrating sphere methods for realizing an absolute diffuse reflectance scale NPArC # 21196171
 
3. State-of-the art comparability of corrected emission spectra.1. Spectral correction with physical transfer standards and spectral fluorescence standards by expert laboratories NPArC # 21268133  
Search for Resch-Genger, Ute; Search for Bremser, Wolfram; Search for Pfeifer, Dietmar; Search for Spieles, Monika; Search for Hoffmann, Angelika; Search for DeRose, Paul C.; Search for Zwinkels, Joanne C.; Search for Gauthier, François; Search for Ebert, Bernd; Search for Taubert, R. Dieter; Search for Monte, Christian; Search for Voigt, Jan; Search for Hollandt, Jörg; Search for Macdonald, Rainer
Analytical Chemistry, 84 (9), 2012-02-28, p. 3889-3898
Resolve DOI: http://dx.doi.org/10.1021/ac2034503
Find@CISTI State-of-the art comparability of corrected emission spectra.1. Spectral correction with physical transfer standards and spectral fluorescence standards by expert laboratories NPArC # 21268133 (Opens in a new window)Find@CISTI State-of-the art comparability of corrected emission spectra.1. Spectral correction with physical transfer standards and spectral fluorescence standards by expert laboratories NPArC # 21268133
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View full text State-of-the art comparability of corrected emission spectra.1. Spectral correction with physical transfer standards and spectral fluorescence standards by expert laboratories NPArC # 21268133
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4. State-of-the Art comparability of corrected emission spectra. 2. Field laboratory assessment of calibration performance using spectral fluorescence standards NPArC # 21268134  
Search for Resch-Genger, Ute; Search for Bremser, Wolfram; Search for Pfeifer, Dietmar; Search for Spieles, Monika; Search for Hoffmann, Angelika; Search for DeRose, Paul C.; Search for Zwinkels, Joanne C.; Search for Gauthier, François; Search for Ebert, Bernd; Search for Taubert, R. Dieter; Search for Voigt, Jan; Search for Hollandt, Jörg; Search for Macdonald, Rainer
Analytical Chemistry, 84 (9), 2012-02-28, p. 3899-3907
Resolve DOI: http://dx.doi.org/10.1021/ac203451g
Find@CISTI State-of-the Art comparability of corrected emission spectra. 2. Field laboratory assessment of calibration performance using spectral fluorescence standards NPArC # 21268134 (Opens in a new window)Find@CISTI State-of-the Art comparability of corrected emission spectra. 2. Field laboratory assessment of calibration performance using spectral fluorescence standards NPArC # 21268134
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View full text State-of-the Art comparability of corrected emission spectra. 2. Field laboratory assessment of calibration performance using spectral fluorescence standards NPArC # 21268134
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5. CIE whiteness assessment of papers: impact of LED illumination NPArC # 18560945
Search for Zwinkels, J. C.; Search for Noël, M.
Proceedings of the 27th Session of the CIE Sun City, South Africa, 9 - 16 July 2011, (27th Session of the CIE, 10-15 July 2011, Sun City, South Africa), 2011-07-31
View full text CIE whiteness assessment of papers: impact of LED illumination NPArC # 18560945
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6. Photometry, radiometry and ‘the candela’: evolution in the classical and quantum world NPArC # 17101698  
Search for Zwinkels, Joanne C.; Search for Ikonen, Erkki; Search for Fox, Nigel P.; Search for Ulm, Gerhard; Search for Rastello, Maria Luisa
Metrologia, 47 (5), 2010-08-03, p. R15-R32
Resolve DOI: http://dx.doi.org/10.1088/0026-1394/47/5/R01
Find@CISTI Photometry, radiometry and ‘the candela’: evolution in the classical and quantum world NPArC # 17101698 (Opens in a new window)Find@CISTI Photometry, radiometry and ‘the candela’: evolution in the classical and quantum world NPArC # 17101698
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7. Metrology of photoluminescent materials NPArC # 15093676  
Search for Zwinkels, Joanne
Metrologia, 47 (2), 2010-03-08, p. S182-S193
Resolve DOI: http://dx.doi.org/10.1088/0026-1394/47/2/S15
Find@CISTI Metrology of photoluminescent materials NPArC # 15093676 (Opens in a new window)Find@CISTI Metrology of photoluminescent materials NPArC # 15093676
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8. How white is white? [NMI News] NPArC # 5764205  
Search for Zwinkels, J.
NCSL International measure, ISSN: 19315775, 3 (2), 2008, p. 13
Find@CISTI How white is white? [NMI News] NPArC # 5764205 (Opens in a new window)Find@CISTI How white is white? [NMI News] NPArC # 5764205
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9. Surface fluorescence: the only standardized method of measuring luminescence NPArC # 8899679
Search for Zwinkels, J.
Standardization and quality assurance in fluorescence measurements I : techniques, ISBN: 9783540752066, 2008
Share It Surface fluorescence: the only standardized method of measuring luminescence NPArC # 8899679
 
10. Use of CIE colorimetry in the pulp, paper, and textile industries NPArC # 5763365
Search for Hirschler, R.; Search for Zwinkels, J.
Colorimetry : understanding the CIE System, ISBN: 9780470049044, 2007
Share It Use of CIE colorimetry in the pulp, paper, and textile industries NPArC # 5763365
 
11. National Research Council of Canada Liaison report from the Photometry and Radiometry Group : Optical characterization of nanomaterials NPArC # 8897924  
Search for Zwinkels, J.; Search for Rowell, N. L.
Optical radiation news, No. 87, 2007, p. 15
Find@CISTI National Research Council of Canada Liaison report from the Photometry and Radiometry Group : Optical characterization of nanomaterials NPArC # 8897924 (Opens in a new window)Find@CISTI National Research Council of Canada Liaison report from the Photometry and Radiometry Group : Optical characterization of nanomaterials NPArC # 8897924
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12. Use of CIE colorimetry in the pulp, paper, and textile industries NPArC # 8896518
Search for Hirschler, R.; Search for Zwinkels, J.
Colorimetry : understanding the CIE System, ISBN: 9780470049044, 2007
Share It Use of CIE colorimetry in the pulp, paper, and textile industries NPArC # 8896518
 
13. National Research Council of Canada Liaison report from the Photometry and Radiometry Group : Photoluminescent effect of ceramic tiles used in CCPR key comparison of spectral diffuse reflectance (CCPR-K5) NPArC # 8898588  
Search for Zwinkels, J.
Optical radiation news, No. 87, 2007, p. 15
Find@CISTI National Research Council of Canada Liaison report from the Photometry and Radiometry Group : Photoluminescent effect of ceramic tiles used in CCPR key comparison of spectral diffuse reflectance (CCPR-K5) NPArC # 8898588 (Opens in a new window)Find@CISTI National Research Council of Canada Liaison report from the Photometry and Radiometry Group : Photoluminescent effect of ceramic tiles used in CCPR key comparison of spectral diffuse reflectance (CCPR-K5) NPArC # 8898588
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14. "An Amorphous to Crystalline Phase Transition within Silicon Films Grown by Ultra-High-Vacuum Evaporation on Silica: The Impact on the Optical Absorption Spectrum" NPArC # 12346661
Search for O'Leary, S.; Search for Orapunt, F.; Search for Tay, Li-Lin; Search for Lockwood, David; Search for Baribeau, J-M; Search for Noël, Mario; Search for Zwinkels, Joanne
(13th Canadian Semiconductor Technology Conference CSTC, Montreal, PQ), 149, 2007
Share It "An Amorphous to Crystalline Phase Transition within Silicon Films Grown by Ultra-High-Vacuum Evaporation on Silica: The Impact on the Optical Absorption Spectrum" NPArC # 12346661
 
15. Optical characterization of a reference instrument for gloss measurements in both a collimated and a converging beam geometry NPArC # 5763288  
Search for Noël, M.; Search for Zwinkels, J.; Search for Liu, J.
Applied optics, ISSN: 0003-6935, 45 (16), 2006, p. 3712-3720
Find@CISTI Optical characterization of a reference instrument for gloss measurements in both a collimated and a converging beam geometry NPArC # 5763288 (Opens in a new window)Find@CISTI Optical characterization of a reference instrument for gloss measurements in both a collimated and a converging beam geometry NPArC # 5763288
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16. Influence of growth temperature on order within silicon films grown by ultrahigh-vacuum evaporation on silica NPArC # 5765205  
Search for Tay, L.; Search for Lockwood, D.; Search for Baribeau, J. M.; Search for Noël, M.; Search for Zwinkels, J.; Search for Orapunt, F.; Search for O'Leary, S. K.
Applied physics letters, ISSN: 0003-6951, 88 (12), 2006, p. 121920
Resolve DOI: http://dx.doi.org/10.1063/1.2189115
Find@CISTI Influence of growth temperature on order within silicon films grown by ultrahigh-vacuum evaporation on silica NPArC # 5765205 (Opens in a new window)Find@CISTI Influence of growth temperature on order within silicon films grown by ultrahigh-vacuum evaporation on silica NPArC # 5765205
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17. Intrinsic wavelength standard absorption bands in holmium oxide solution for UV/visible molecular absorption spectrophotometry NPArC # 8898637  
Search for Travis, J. C.; Search for Acosta, J. C.; Search for Andor, G.; Search for Bastie, J.; Search for Blattner, P.; Search for Chunnilall, C. J.; Search for Crosson, S. C.; Search for Duewer, D. L.; Search for Early, E. A.; Search for Hengstberger, F.; Search for Kim, C. S.; Search for Liedquist, L.; Search for Manoocheri, F.; Search for Mercader, F.; Search for Monard, L. A.G.; Search for Nevas, S.; Search for Mito, A.; Search for Nilsson, M.; Search for Noël, M.; Search for Rodriguez, A. C.; Search for Ruiz, A.; Search for Schirmacher, A.; Search for Smith, M. V.; Search for Valencia, G.; Search for van Tonder, N.; Search for Zwinkels, J.
Journal of physical and chemical reference data, ISSN: 0047-2689, 34 (1), 2005, p. 41-56
Resolve DOI: http://dx.doi.org/10.1063/1.1835331
Find@CISTI Intrinsic wavelength standard absorption bands in holmium oxide solution for UV/visible molecular absorption spectrophotometry NPArC # 8898637 (Opens in a new window)Find@CISTI Intrinsic wavelength standard absorption bands in holmium oxide solution for UV/visible molecular absorption spectrophotometry NPArC # 8898637
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18. Design and characterization of a versatile reference instrument for rapid, reproducible specular gloss measurements NPArC # 8898993  
Search for Liu, J.; Search for Noël, M.; Search for Zwinkels, J.
Applied optics, ISSN: 0003-6935, 44 (22), 2005, p. 4631-4638
Find@CISTI Design and characterization of a versatile reference instrument for rapid, reproducible specular gloss measurements NPArC # 8898993 (Opens in a new window)Find@CISTI Design and characterization of a versatile reference instrument for rapid, reproducible specular gloss measurements NPArC # 8898993
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19. Methods for improving accuracy of optical coating analysis from spectrophotometric measurements NPArC # 5764229  
Search for Zwinkels, J.; Search for Noël, M.
Vacuum technology and coating, 5 (10), 2004, p. 44-49
Find@CISTI Methods for improving accuracy of optical coating analysis from spectrophotometric measurements NPArC # 5764229 (Opens in a new window)Find@CISTI Methods for improving accuracy of optical coating analysis from spectrophotometric measurements NPArC # 5764229
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20. Specular gloss scales comparison between the National Institute of Standards and Technology and the National Research Council of Canada NPArC # 8898657  
Search for Nadal, M.; Search for Zwinkels, J.; Search for Noël, M.
JCT, Journal of coatings technology, ISSN: 0361-8773, 75 (943), 2003, p. 45-51
Find@CISTI Specular gloss scales comparison between the National Institute of Standards and Technology and the National Research Council of Canada NPArC # 8898657 (Opens in a new window)Find@CISTI Specular gloss scales comparison between the National Institute of Standards and Technology and the National Research Council of Canada NPArC # 8898657
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21. An international evaluation of holmium oxide solution reference materials for wavelength calibration in molecular absorption spectrophotometry NPArC # 8900759  
Search for Travis, J. C.; Search for Zwinkels, J.; Search for Mercader, F.; Search for Ruiz, A.; Search for Early, E. A.; Search for Smith, M. V.; Search for Noël, M.; Search for Maley, M.; Search for Kramer, G. W.; Search for Eckerle, K. L.; Search for Duewer, D. L.
Analytical Chemistry, ISSN: 00032700, 74 (14), 2002, p. 3408-3415
Resolve DOI: http://dx.doi.org/10.1021/ac0255680
Find@CISTI An international evaluation of holmium oxide solution reference materials for wavelength calibration in molecular absorption spectrophotometry NPArC # 8900759 (Opens in a new window)Find@CISTI An international evaluation of holmium oxide solution reference materials for wavelength calibration in molecular absorption spectrophotometry NPArC # 8900759
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22. Amorphous silicon films and superlattices grown by molecular beam epitaxy: an optical analysis NPArC # 12346539
Search for Lockwood, D. J.; Search for Baribeau, J.-M.; Search for Noël, M.; Search for Zwinkels, J. C.; Search for Fogal, B. J.; Search for Orapunt, F.; Search for O'leary, S. K.
MRS Proceedings, (2002 MRS Spring Meeting, Symposium A, Amorphous and heterogeneous silicon-based films 2002, 2-5 April 2002, San Francisco, California, USA), 715, 2002
Resolve DOI: http://dx.doi.org/10.1557/PROC-715-A19.1
Share It Amorphous silicon films and superlattices grown by molecular beam epitaxy: an optical analysis NPArC # 12346539
 
23. Optical Absorption in Amorphous Silicon Superlattices Grown by Molecular Beam Epitaxy NPArC # 8899878  
Search for Lockwood, David; Search for Baribeau, Jean-Marc; Search for Noël, Mario; Search for Zwinkels, Joanne; Search for Fogal, B. J.; Search for O'Leary, S. K.
Solid state communications, 122 (5), 2002, p. 271-275
Resolve DOI: http://dx.doi.org/10.1016/S0038-1098(02)00122-9
Find@CISTI Optical Absorption in Amorphous Silicon Superlattices Grown by Molecular Beam Epitaxy NPArC # 8899878 (Opens in a new window)Find@CISTI Optical Absorption in Amorphous Silicon Superlattices Grown by Molecular Beam Epitaxy NPArC # 8899878
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24. Optical Dispersion Relationships in Amorphous Silicon Grown by Molecular Beam Epitaxy NPArC # 8899251  
Search for O'Leary, S. K.; Search for Fogal, B. J.; Search for Lockwood, David; Search for Baribeau, Jean-Marc; Search for Noël, Mario; Search for Zwinkels, Joanne
Journal of Non-Crystalline Solids, 290 (1), 2001, p. 57-63
Resolve DOI: http://dx.doi.org/10.1016/S0022-3093(01)00728-1
Find@CISTI Optical Dispersion Relationships in Amorphous Silicon Grown by Molecular Beam Epitaxy NPArC # 8899251 (Opens in a new window)Find@CISTI Optical Dispersion Relationships in Amorphous Silicon Grown by Molecular Beam Epitaxy NPArC # 8899251
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25. Disorder and the optical properties of amorphous silicon grown by molecular beam epitaxy NPArC # 8899940  
Search for Fogal, B. J.; Search for O'Leary, S. K.; Search for Lockwood, David; Search for Baribeau, Jean-Marc; Search for Noël, Mario; Search for Zwinkels, Joanne
Solid state communications, 120 (11), 2001, p. 429-434
Resolve DOI: http://dx.doi.org/10.1016/S0038-1098(01)00422-7
Find@CISTI Disorder and the optical properties of amorphous silicon grown by molecular beam epitaxy NPArC # 8899940 (Opens in a new window)Find@CISTI Disorder and the optical properties of amorphous silicon grown by molecular beam epitaxy NPArC # 8899940
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