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Journal of Modern Optics, ISSN: 0950-0340, 60 (14), 2013-08-08, p. 1115-1123
 
Journal of Modern Optics, 2013-11-01, p. 1099
 
2012-06-01
 
Analytical Chemistry, 84 (9), 2012-02-28, p. 3889-3898
 
Analytical Chemistry, 84 (9), 2012-02-28, p. 3899-3907
 
Reflection, Scattering, and Diffraction from Surfaces III, (Rlection, Scattering, and Diffraction from Surfaces III, 13-16 August 2012, San Diego, California, USA), 2012-10-16, p. 84950A-1-84950A-10
 
Proceedings of the 27th Session of the CIE Sun City, South Africa, 9 - 16 July 2011, (27th Session of the CIE, 10-15 July 2011, Sun City, South Africa), ISBN: 9783901906992, 2011-07-31, p. 323-330
 
Metrologia, 47 (2), 2010-03-08, p. S182-S193
 
Metrologia, 47 (5), 2010-08-03, p. R15-R32
 
Standardization and quality assurance in fluorescence measurements I : techniques, ISBN: 9783540752066, 2008
 
NCSL International measure, ISSN: 19315775, 3 (2), 2008, p. 13
 
Optical radiation news, No. 87, 2007, p. 15
 
(13th Canadian Semiconductor Technology Conference CSTC, Montreal, PQ), 149, 2007
 
Colorimetry : understanding the CIE System, ISBN: 9780470049044, 2007
 
Colorimetry : understanding the CIE System, ISBN: 9780470049044, 2007
 
Optical radiation news, No. 87, 2007, p. 15
 
Applied physics letters, ISSN: 0003-6951, 88 (12), 2006, p. 121920
 
Applied optics, ISSN: 0003-6935, 45 (16), 2006, p. 3712-3720
 
Journal of physical and chemical reference data, ISSN: 0047-2689, 34 (1), 2005, p. 41-56
 
Applied optics, ISSN: 0003-6935, 44 (22), 2005, p. 4631-4638
 
Vacuum technology and coating, 5 (10), 2004, p. 44-49
 
JCT, Journal of coatings technology, ISSN: 0361-8773, 75 (943), 2003, p. 45-51
 
MRS Proceedings, (2002 MRS Spring Meeting, Symposium A, Amorphous and heterogeneous silicon-based films 2002, 2-5 April 2002, San Francisco, California, USA), 715, 2002
 
Solid state communications, 122 (5), 2002, p. 271-275
 
Analytical Chemistry, ISSN: 00032700, 74 (14), 2002, p. 3408-3415
 
 
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