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DOI: Resolve DOI: http://dx.doi.org/10.1016/S0038-1098(01)00422-7
 

Disorder and the optical properties of amorphous silicon grown by molecular beam epitaxy

 
 
Author(s):
Search for Fogal, B. J.; Search for O'Leary, S. K.; Search for Lockwood, David; Search for Baribeau, Jean-Marc; Search for Noël, Mario; Search for Zwinkels, Joanne
Affiliation:
NRC Institute for Microstructural Sciences; National Research Council Canada; NRC Institute for National Measurement Standards
Type:
Article
Journal:
Solid state communications
Volume:
120
Issue:
11
Date:
2001
Pages :
429-434
NPArC #:
8899940
 
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Date Created: 2010-03-29
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