Quality Control with Analytical Plotters

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TypeArticle
ConferenceProceedings of the 39th Photogrammetric Week, 1983, Stuttgart, Germany
Publication date
LanguageEnglish
AffiliationNRC Institute for Information Technology; National Research Council Canada
Peer reviewedNo
NRC number22225
NPARC number8900605
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Record identifier0f7af63b-791f-4d84-932b-3cf7be85c05d
Record created2009-04-22
Record modified2016-05-09
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