Strain determination in bi-layer systems using HREM

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TypeArticle
Journal title9th Intl. Conf. on Microscopy of Semicond. Mat. (accepted).
AffiliationNational Research Council Canada; NRC Institute for Fuel Cell Innovation; NRC Steacie Institute for Molecular Sciences
Peer reviewedNo
NPARC number12327247
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Record identifier246851cb-8669-4d52-b410-ded5baa36c6a
Record created2009-09-10
Record modified2016-05-09
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