The linewidth broadening factor: a length-scale-dependent analytical approach

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DOIResolve DOI: http://doi.org/10.11648/j.nano.20170501.11
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TypeArticle
Journal titleAmerican Journal of Nano Research and Applications
ISSN2575-3738
Volume5
Issue1
Pages16
Subjectα–factor; linewidth; enhancement; scattering; spontaneous emission; exciton; mesoscopic; quantum dot
AbstractA first-order frequency-dependent formula of the linewidth broadening factor (α–factor) is derived in terms of scattering rates whilst, a mesoscopic disk approach is used in order to accompany the dimension effect to the spontaneous emission lifetime (inverse of scattering rate). An excitonic correction to the relaxation properties is shown to occur provided the binding energy of the electron and hole is comparable to their eigenenergy-separation. The ensuing analysis is independent of the selected III-V material system and resides upon three simplifying assumptions which allow for analytical formulae to be derived.
Publication date
PublisherScience Publishing Group
LanguageEnglish
AffiliationNational Research Council Canada; Advanced Electronics and Photonics
Peer reviewedYes
NPARC number23002467
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Record identifier80ed0a00-3c4e-4b50-ba64-abbeff96a538
Record created2017-11-14
Record modified2017-11-14
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