All-electronic nanosecond-resolved scanning tunneling microscopy: facilitating the investigation of single dopant charge dynamics

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TypeArticle
Journal titleCondensed Matter
Article numberarXiv:1706.08906
Pages# of pages: 18
AbstractThe miniaturization of semiconductor devices to the scales where small numbers of dopants can control device properties requires the development of new techniques capable of characterizing their dynamics. Investigating single dopants requires sub-nanometer spatial resolution which motivates the use of scanning tunneling microscopy (STM), however, conventional STM is limited to millisecond temporal resolution. Several methods have been developed to overcome this shortcoming. Among them is all-electronic time-resolved STM, which is used in this work to study dopant dynamics in silicon with nanosecond resolution. The methods presented here are widely accessible and allow for local measurement of a wide variety of dynamics at the atomic scale. A novel time-resolved scanning tunneling spectroscopy technique is presented and used to efficiently search for dynamics.
Publication date
PublisherCornell University Library
Linkhttps://arxiv.org/abs/1706.08906
LanguageEnglish
AffiliationNational Research Council Canada; National Institute for Nanotechnology; Security and Disruptive Technologies
Peer reviewedNo
NPARC number23002378
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Record identifierb370cdc9-0ae9-47f0-9a4e-00fed9191f84
Record created2017-10-25
Record modified2017-10-25
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