Band gap measurement of Bi2MoxW1-xO6 by low loss electron energy loss spectroscopy

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DOIResolve DOI: http://doi.org/10.1016/j.mssp.2017.02.016
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TypeArticle
Journal titleMaterials Science in Semiconductor Processing
ISSN1369-8001
Volume63
Pages184189
Subjectelectron energy loss spectroscopy (eels); transmission electron microscopy; band gap; energy loss function; Bi2MoxW1−xO6
AbstractThis work shows the comparison of high-resolution electron energy loss spectra (HR-EELS) in the low loss region (0−15 eV) to investigate the electronic structure from koechilinite Bi2MoO6 to rusellite Bi2WO6 varying the stoichiometric relation Bi2MoxW1−xO6. The effect of the Mo to W ratio on the bandgap energy was evaluated on individual particles. Two approximations were considered in order to determine the band gap energy value, the first one was a linear fit and the second one was a mathematical fit. Both analyses are in agreement with those ones collected and analyzed by UV–Vis characterization. Our results suggest a direct electronic transition that increases from about 2.53 eV to about 3 eV as the W content increase from 0% to 100% wt. X-ray diffraction was used to corroborate the crystal structure and crystal size; transmission electron microscopy was used to monitor the morphology evolution and UV–Vis spectroscopy in diffuse reflectance mode to determine the Eg. These techniques complement the characterization of these materials.
Publication date
PublisherElsevier
LanguageEnglish
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number23002387
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Record identifierbeb87cda-8af7-46b2-9c46-370523d8b87c
Record created2017-10-26
Record modified2017-10-26
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