In-line holographic electron microscopy in the presence of external magnetic fields

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DOIResolve DOI: http://doi.org/10.1016/j.ultramic.2007.08.001
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TypeArticle
Journal titleUltramicroscopy
Volume108
Issue5
Pages472480; # of pages: 9
AbstractIt is now a well-known fact that the phase of electron waves is altered by external magnetic fields via the Aharonov–Bohm effect. This implies that any electron interference effects will be to some degree affected by the presence of such fields. In this study we examine the distortion effects of external (constant and variable) magnetic fields on electron interference and holography. For digital holography, the reconstruction of the object is done via numerical calculations and this leaves the door open for correcting phase distortions in the hologram reconstruction. We design and quantitatively assess such correction schemes, which decidedly depend on our knowledge of the magnetic field values in the holographic recording process. For constant fields of known value we are able to correct for magnetic distortions to a great extent. We find that variable fields are more destructive to the holographic process than constant fields. We define two criteria, related respectively to global and local contrast of the hologram to establish the maximum allowed external field which does not significantly hinder the accuracy of in-line holographic microscopy with electrons.
Publication date
LanguageEnglish
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NRC number523
NPARC number8926301
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Record identifiercbecf231-60e0-4480-9608-5d0978d6dc7b
Record created2009-04-23
Record modified2016-05-09
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