Silicon nanowire based radio-frequency spectrum analyser

DOIResolve DOI: http://doi.org/10.1109/ECOC.2010.5621130
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TypeArticle
Proceedings title36th European Conference and Exhibition on Optical Communication
Conference2010 36th European Conference and Exhibition on Optical Communication, ECOC 2010, September 19-23, 2010, Torino, Italy
ISBN978-1-4244-8536-9
Pages13
AbstractWe demonstrate a silicon nanowire based radio frequency spectrum analyser based on cross-phase modulation. We show that the device is accurate, with cross-chirp from photogenerated free-carriers negligible and measure RF spectra for 640Gbaud on-off-keyed data.
Publication date
PublisherIEEE
LanguageEnglish
AffiliationNRC Industrial Materials Institute; National Research Council Canada
Peer reviewedYes
NPARC number23002572
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Record identifierce6f1fe6-c39c-4e7e-bb13-378a95187667
Record created2017-11-30
Record modified2017-11-30
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